A research team led by Associate Professor Hu Huan at the Zhejiang University–University of Illinois Urbana-Champaign Institute (ZJUI) has made advances in the interface engineering of two-dimensional materials. The study, titled Threshold Force Study for the Scanning Probe-Based 2D Material Bubble Removal Method, was presented at the 2026 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO 2026), where it received the Best Student Paper Award. Du Kaitai, a 2025 master's student in Mechanical Engineering at Zhejiang University, is the first author. Associate Professor Hu Huan is the sole corresponding author. The co-authors include Associate Professor Huang Changjin and Lei Ziyang, a 2025 master's student in Mechanical Engineering, both from Singapore Nanyang Technological University.